|Organizers||Sebastien Deleersnyder Sebastien Deleersnyder|
|Participants||Yan Kravchenko Yan Kravchenko , Claudio Camerino Claudio Camerino , John Dileo John Dileo , Pat Duarte Pat Duarte , Yasmin Martin Yasmin Martin|
Discussion about measuring according to coverage vs. quality. How do we want to measure in SAMM 2.0?
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